in partnership with the Royal Microscopical Society (RMS) and the European Microscopy Society (EMS)

10-11 December 2020

Chair: Prof Anna Baldycheva, University of Exeter

This 2 day symposium will focus on an emerging field of microscopy; the in-situ characterisation of novel smart nanomaterials based systems and devices. Internationally known experts in Smart Technologies will join the symposium to discuss the most critical technological insights, discoveries and new practical applications in microscopy and micro-spectroscopy characterisation for a wide range materials: from 2D, chalcogenide, perovskites and group IV materials, organic and quantum dot nanomaterials, detonation nanodiamonds, liquid crystals and fluid nanocomposites, to porous and metal coatings, nanobiofilms, thermoplastic nanocomposites, textiles and chainmail fabrics.

The symposium will cover fundamental techniques such as optical microscopy, TEM, SEM, AFM, Raman, and FTIR for a wide range of possible applications, from chemistry and material fabrication to in-situ systems engineering. The conference will also include workshop with hands-on demonstrations and possibility to test participant’s samples on-site.

Speakers

Stanislav Leesment

NT-MDT Spectrum Instruments

Coming soon...

Igor Meglinski

University of Oulu

Coming soon...

Tatiana Perova

Triniti College Dublin

Coming soon...

Alexander Baranov

ITMO University

In 1975, Alexander Baranov graduated from Leningrad State University with a degree in Optics and Spectroscopy. In 1979, he defended his PhD thesis in Quantum Electronics, while in 1999, he defended his DSc thesis in Optics.
From 1978 to 2006, he worked at the Vavilov State Optical Institute (St. Petersburg) as a junior and then chief research assistant. From 2006, he has been working at ITMO University as a Professor at the Faculty of Photonics and Optical Information, as well as the Head of ITMO's Laboratory of Optics of Quantum Nanostructures, and a Chief Research Associate of the Center of Optical Information Technologies.