In partnership with the Royal Microscopical Society (RMS)


  • Anna Baldycheva, Exeter University
  • Stanislav Leesment, NT-MDT Spectrum Instruments

This 2 day symposium will focus on an emerging field of microscopy; the in-situ characterisation of novel smart nanomaterials based systems and devices. Internationally known experts in Smart Technologies will join the symposium to discuss the most critical technological insights, discoveries and new practical applications in microscopy and micro-spectroscopy characterisation for a wide range materials: from 2D, chalcogenide, perovskites and group IV materials, organic and quantum dot nanomaterials, detonation nanodiamonds, liquid crystals and fluid nanocomposites, to porous and metal coatings, nanobiofilms, thermoplastic nanocomposites, textiles and chainmail fabrics.

The symposium will cover fundamental techniques such as optical microscopy, TEM, SEM, AFM, Raman, and FTIR for a wide range of possible applications, from chemistry and material fabrication to in-situ systems engineering. A Special Session devoted to the recent developments in the field of Scanning tunnelling microscopy (STM) will be organized on the second day of the Symposium

The conference will also include workshop with hands-on demonstrations and possibility to test participant’s samples on-site.


Anna Baldycheva

University of Exeter / STEMM Global

Stanislav Leesment

NT-MDT Spectrum Instruments

Igor Meglinski

University of Oulu

Alexey Feofanov

Lomonosov Moscow State University